Highly oriented pyrolytic graphite
Template:Short description Highly oriented pyrolytic graphite (HOPG) is a highly pure and ordered form of synthetic graphite. It is characterised by a low mosaic spread angle, meaning that the individual graphite crystallites are well aligned with each other. The best HOPG samples have mosaic spreads of less than 1 degree.
Note that the term "highly ordered pyrolytic graphite" is sometimes used for this material, but IUPAC favors "highly oriented".[1]
Synthesis
The method used to produce HOPG is based on the process used to make pyrolytic graphite, but with additional tensile stress in the basal-plane direction. This produces improved alignment of the graphite crystallites and an interplanar spacing close to that observed in natural graphite. The "stress recrystallization" of graphite was first described by L. C. F. Blackman and Alfred Ubbelohde in 1962.[2]
The diameters of the individual crystallites in HOPG are typically in the range 1–10 μm.[3]
Application
HOPG is used in x-ray optics as a monochromator and in scanning probe microscopy as a substrate and for magnification calibration.[4][5]
References
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- ^ IUPAC, Compendium of Chemical Terminology, 5th ed. (the "Gold Book") (2025). Online version: (2006–) "Highly oriented pyrolytic graphite". Script error: No such module "CS1 identifiers"..
- ^ Page Module:Citation/CS1/styles.css has no content.L. C. F. Blackman; A. R. Ubbelohde (1962). "Stress Recrystallization of Graphite". Proceedings of the Royal Society of London. A266 (1324): 20–32. Bibcode:1962RSPSA.266...20B. doi:10.1098/rspa.1962.0044. hdl:2013/ULB-DIPOT:oai:dipot.ulb.ac.be:2013/277583. S2CID 136690560.
- ^ Page Module:Citation/CS1/styles.css has no content.A. W. Moore (1973). "Highly oriented pyrolytic graphite". Chemistry and Physics of Carbon. 11: 69–187.
- ^ Page Module:Citation/CS1/styles.css has no content.R. V. Lapshin (1998). "Automatic lateral calibration of tunneling microscope scanners" (PDF). Review of Scientific Instruments. 69 (9): 3268–3276. Bibcode:1998RScI...69.3268L. doi:10.1063/1.1149091. ISSN 0034-6748.
- ^ Page Module:Citation/CS1/styles.css has no content.R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode" (PDF). Applied Surface Science. 470: 1122–1129. arXiv:1501.06679. Bibcode:2019ApSS..470.1122L. doi:10.1016/j.apsusc.2018.10.149. ISSN 0169-4332. S2CID 119275633.
